Instruments and Services

Magellan 400

Magellan 400

FESEM: Magellan 400 (FEI)

Digital Field Emission Scanning Electron Microscope (FESEM), record high spatial resolution 0.6nm

Fib Helios Nano Lab Dual Beam 600 Fei

Helios NanoLabTM Dual Beam 600

SEM/FIB Workstation: Helios NanoLab DualBeam 600 (FEI)

SEM/Focus Ion Beam (FIB) Workstation that is capable of nano-prototyping, nano-machining, nano-analysis, and advanced TEM sample preparation


EVO 50 Zeiss

Environmental SEM: EVO 50 LEO (Carl Zeiss)

Environmental SEM with Peltier Stage, allows operation under high and low vacuum conditions

Titan Tem

Titan 80-300

TEM: Titan 80-300 (FEI)

Transmission Electron Microscope (TEM) enables sub-Angstrom, atomic scale discovery and exploration in both EM and STEM modes over a wide range of materials and operating conditions

Em Scope

JEOL 2011

TEM: JEOL 2011

Transmission Electron Microscope (TEM) 80-200 kV, 0.14 nm resolution, a workhorse for materials and biological samples


Cameca SX-50

Electron Probe Analyzer: Cameca SX-50

Electron Microprobe, quantitative elemental analysis and imaging (B to U) with micron resolution using either energy or wavelength detection