Instruments and Services
Magellan 400
FESEM: Magellan 400 (FEI)
Digital Field Emission Scanning Electron Microscope (FESEM), record high spatial resolution 0.6nm
Helios NanoLabTM Dual Beam 600
SEM/FIB Workstation: Helios NanoLab DualBeam 600 (FEI)
SEM/Focus Ion Beam (FIB) Workstation that is capable of nano-prototyping, nano-machining, nano-analysis, and advanced TEM sample preparation
EVO 50 Zeiss
Environmental SEM: EVO 50 LEO (Carl Zeiss)
Environmental SEM with Peltier Stage, allows operation under high and low vacuum conditions
Titan 80-300
TEM: Titan 80-300 (FEI)
Transmission Electron Microscope (TEM) enables sub-Angstrom, atomic scale discovery and exploration in both EM and STEM modes over a wide range of materials and operating conditions
JEOL 2011
TEM: JEOL 2011
Transmission Electron Microscope (TEM) 80-200 kV, 0.14 nm resolution, a workhorse for materials and biological samples
Cameca SX-50
Electron Probe Analyzer: Cameca SX-50
Electron Microprobe, quantitative elemental analysis and imaging (B to U) with micron resolution using either energy or wavelength detection