Instruments and Services
Magellan 400
FESEM: Magellan 400 (FEI)
Digital Field Emission Scanning Electron Microscope (FESEM), record high spatial resolution 0.6nm
Helios G4 Ux Dual Beam
SEM/FIB Workstation: Helios G4 Ux DualBeam (FEI)
The Helios G4 UX is a fully digital, Extreme High Resolution (XHR) Field Emission Scanning Electron Microscope (FE SEM) equipped with Focused Ion Beam (FIB) technology.
Titan 80-300
TEM: Titan 80-300 (FEI)
Transmission Electron Microscope (TEM) enables sub-Angstrom, atomic scale discovery and exploration in both EM and STEM modes over a wide range of materials and operating conditions
JEOL 2011
TEM: JEOL 2011
Transmission Electron Microscope (TEM) 80-200 kV, 0.14 nm resolution, a workhorse for materials and biological samples