Instruments and Services

Magellan 400

Magellan 400

FESEM: Magellan 400 (FEI)

Digital Field Emission Scanning Electron Microscope (FESEM), record high spatial resolution 0.6nm

Fei Helios G4 Ux

Helios G4 Ux Dual Beam

SEM/FIB Workstation: Helios G4 Ux DualBeam (FEI)

The Helios G4 UX is a fully digital, Extreme High Resolution (XHR) Field Emission Scanning Electron Microscope (FE SEM) equipped with Focused Ion Beam (FIB) technology.


Titan Tem

Titan 80-300

TEM: Titan 80-300 (FEI)

Transmission Electron Microscope (TEM) enables sub-Angstrom, atomic scale discovery and exploration in both EM and STEM modes over a wide range of materials and operating conditions

Em Scope

JEOL 2011

TEM: JEOL 2011

Transmission Electron Microscope (TEM) 80-200 kV, 0.14 nm resolution, a workhorse for materials and biological samples