Instruments and Services
FESEM: Magellan 400 (FEI)
Digital Field Emission Scanning Electron Microscope (FESEM), record high spatial resolution 0.6nm
SEM/FIB Workstation: Helios G4 Ux DualBeam (FEI)
The Helios G4 UX is a fully digital, Extreme High Resolution (XHR) Field Emission Scanning Electron Microscope (FE SEM) equipped with Focused Ion Beam (FIB) technology.
TEM: Titan 80-300 (FEI)
Transmission Electron Microscope (TEM) enables sub-Angstrom, atomic scale discovery and exploration in both EM and STEM modes over a wide range of materials and operating conditions
TEM: JEOL 2011
Transmission Electron Microscope (TEM) 80-200 kV, 0.14 nm resolution, a workhorse for materials and biological samples
Currently JEOL 2011 TEM microscope is available for bio sample imaging at room temperature and cryo conditions.
JEOL 2011 TEM is located in Stinson Remick Hall, Room B08.