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TEM: Titan 80-300 (FEI)

Titandata 1

The Titan 80-300 microscope incorporates a novel platform that allows ultimate stability, performance and flexibility.  For more information on using this instrument, please refer to our policies and rates.

  • High Resolution (HR) TEM mode
  • HR Scanning TEM (STEM) mode
  • HR Electron Energy Loss Spectroscopy (EELS)
  • HR Energy Dispersive X-Ray (EDX)

Features and specifications (at 300 kV)

  • Energy Spread  -  0.7 eV
  • Point Resolution -  0.2 nm
  • Information limit - < 0.1 nm

  • Titandata 2

    STEM Resolution  - 0.136 nm

Application

  • TEM images and Electron Diffraction
  • High Resolution TEM images at Angstrom resolution
  • High throughput STEM mode at Angstrom resolution
  • EDX- compositional analysis at nm-scale
  • Electron Energy Loss Spectroscopy (EELS can obtain elemental and chemical information (such as valence and the coordination of specific atoms) with nanometer resolution.