Exploring Materials with EDX in TEM
Energy-dispersive X-ray spectroscopy (EDX) is a powerful analytical technique that provides chemical information about a sample with nanometer-scale spatial resolution. In transmission electron microscopy (TEM), EDX is a widely used tool for the analysis of materials, allowing researchers to investigate the composition and distribution of elements across samples. In this lecture, we will discuss the principles and applications of EDX in TEM, including the fundamentals of X-ray generation, detection, and analysis, and the factors that affect the accuracy and sensitivity of the measurements. Using practical examples, we will showcase the diverse applications of EDX in solving scientific problems, highlighting its strengths and limitations.
Pavel is currently a Postdoctoral Scholar with Dr. Alexander Mukasyan as part of the Notre Dame Integrated Imaging Facility (NDIIF). He obtained his bachelor's and master's degrees in chemistry from Saint Petersburg State University in Russia. Pavel then pursued his doctoral degree in Physical Chemistry at the Swiss Federal Institute of Technology in Lausanne (EPFL), Switzerland, where he worked on the development of novel experimental techniques in TEM. After graduation, he continued his research as a Postdoctoral researcher at Ulsan National Institute of Science and Technology (UNIST) in South Korea. Pavel's research interests include various types of in situ TEM studies and the development of novel experimental approaches for TEM.
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