Introduction to In-Situ Transmission Electron Microscopy Presented by DENS Solutions & Nanoscience Instruments
Speaker: Cliff Mathisen, Nanoscience Instruments
Abstract: Transmission Electron Microscopy (TEM) has long been a powerful tool for imaging and analyzing nanoscale structures with exceptional resolution. However, traditional TEM techniques are often limited to static observations, leaving a significant gap in our understanding of dynamic processes at the atomic and nanoscale
levels. In-Situ Transmission Electron Microscopy (In-Situ TEM) has emerged as a revolutionary
technique that bridges this gap by enabling real- time imaging and analysis of dynamic phenomena within a controlled environment.
This presentation will introduce the fundamental principles and applications of In-Situ TEM,
highlighting its pivotal role in unraveling mysteries at the nanoscale. We will explore the key
components of an In-Situ TEM setup, including specialized holders and sample chambers,
which provide the necessary conditions for dynamic observations. The integration of advanced
imaging modes, such as high-speed imaging, diffraction, and spectroscopy, will also be
discussed, showcasing the versatility of this technique for a wide range of applications.
Furthermore, this presentation will delve into a selection of compelling applications of In-Situ
TEM, ranging from materials science to biology and beyond. Examples will include the real-time
monitoring of phase transformations, nucleation and growth processes, catalysis and
electrochemistry, and the behavior of nanoparticles under various environmental conditions.
Through these case studies, we will illustrate how In-Situ TEM has revolutionized our
understanding of dynamic processes, opening up new avenues for scientific discovery and how
DENS Solutions instrumentation is contributing to technological innovation.