Christopher Shuck

2016 Best Electron Microscopy Publication Imaging Award

The 2016 Best Electron Beam Imaging Publication was awarded to Christopher Shuck, a graduate student working with Professor A. Mukasyan in the Department of Chemical and Biomolecular Engineering. 

Shuck and coworkers published a paper entitled “Ni/Al Energetic Nanocomposites and the Solid Flame Phenomenon”. The study work used a Focused Ion Beam (FIB) instrument to collect thousands of images of the nanocomposite Ni/Al system with nanometer accuracy. Using these images, the internal structure of the nanocomposite material was quantitatively analyzed using 3D reconstruction techniques. They determined surface contact between the reactants, layer thickness distributions, and then related them in a quantitative fashion to observed properties. The study was published in The Journal of Physical Chemistry C, 2016, 120, 27066.