Magellan 400

Mc 7

The Magellan 400 - field emission scanning electron microscope (FESEM) with extra high spatial resolution (XHR): 0.6 nm @ 15 kV, 0.9 nm @ 1 kV. 

The Magellan XHR FESEM also allows sample imaging at extremely low beam energies (<100 eV), avoiding charge effect at non-conductive nano-scale surfaces.

Features & Specifications

  • Dual-mode magnetic immersion / field free lens electron optics
  • Everhart-Thornley SE detector for secondary electron (SE) detection.
  • In-lens SE and back-scattered electron (BSE) detection specially designed for high-resolution imaging at both high and low accelerating voltages in the range of 0.05-30 KeV;
  • UC monochromator technology, enabling sub-nanometer performance at low energies
  • Beam deceleration technology for low energy imaging of non-conductive specimens;
  • Integrated IR CCD camera for in-chamber viewing;
  • Retractable Annular STEM Detector enables scanning transmission imaging in bright field, dark field and high-angle dark field modes.
  • Retractable Circular Backscattered electron detector (CBS), designed for Z- contrast imaging
  • Energy Dispersive X- Ray Spectrometer  (EDS) Bruker
  • SLEW Window, detection of elements from Z=5 (boron) and up;
  • Energy resolution 123 eV (MnKα, 0 - 100,000 cps);
  • Elemental mapping, line scan, point analysis.


Stinson Remick B30

Output Images